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Fundamentals of Modern VLSI Devices

Description

Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally-renowned authors highlight the intricate interdependencies and subtle tradeoffs between various practically important device parameters, and also provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model, and SiGe-base bipolar devices.

Keywords

effective normal field base doping profile emitter delay time modern bipolar devices nonuniformly doped case nonscaling factors gate depletion width channel length direction quasineutral base region collector current density collector doping profile inversion charge density collector doping concentration nonscaling effects nonuniform channel doping pedestal collector retrograde channel profile base doping concentration modern bipolar transistors base widening velocity saturation model deep emitter device design purposes electron current entering buffered delay

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